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Copula-based reliability analysis of gamma degradation process and Weibull failure time

Copula-based reliability analysis of gamma degradation process and Weibull failure time The purpose of this paper is the reliability analysis for systems with dependent gamma degradation process and Weibull failure time.Design/methodology/approachConsider a life testing experiment in which a sample of n devices starts to operate at t=0 and the data are available on failure time and failure-evolving process on each individual, called in some contents wear or degradation. Ignoring the between performance characteristics dependency structure may lead us to different reliability estimations, while the dependency justly exists. In previous research, dependency between the degradation process and hard failure time has been studied in limited detail (special closed form expression). Thereafter, the dependency between two degradation processes with the same structure (gamma process) in a system is considered using the copula function.FindingsThe results indicate that ignoring the dependency structure may lead us to different reliability estimations while the dependency justly exists.Originality/valueThis study gives some contributions that evaluate reliability metrics with more than one failure mechanism that may not be independent and possibly follow a different distribution function. The authors have used the copula function as a basis to develop a proposal model and analysis methods. In addition, the authors discussed the identifiability of the copula. Finally, simulation data were used to review the suggested approach. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png International Journal of Quality & Reliability Management Emerald Publishing

Copula-based reliability analysis of gamma degradation process and Weibull failure time

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References (28)

Publisher
Emerald Publishing
Copyright
© Emerald Publishing Limited
ISSN
0265-671X
DOI
10.1108/ijqrm-04-2018-0100
Publisher site
See Article on Publisher Site

Abstract

The purpose of this paper is the reliability analysis for systems with dependent gamma degradation process and Weibull failure time.Design/methodology/approachConsider a life testing experiment in which a sample of n devices starts to operate at t=0 and the data are available on failure time and failure-evolving process on each individual, called in some contents wear or degradation. Ignoring the between performance characteristics dependency structure may lead us to different reliability estimations, while the dependency justly exists. In previous research, dependency between the degradation process and hard failure time has been studied in limited detail (special closed form expression). Thereafter, the dependency between two degradation processes with the same structure (gamma process) in a system is considered using the copula function.FindingsThe results indicate that ignoring the dependency structure may lead us to different reliability estimations while the dependency justly exists.Originality/valueThis study gives some contributions that evaluate reliability metrics with more than one failure mechanism that may not be independent and possibly follow a different distribution function. The authors have used the copula function as a basis to develop a proposal model and analysis methods. In addition, the authors discussed the identifiability of the copula. Finally, simulation data were used to review the suggested approach.

Journal

International Journal of Quality & Reliability ManagementEmerald Publishing

Published: Apr 18, 2019

Keywords: Copula function; Degradation process; Gamma process; General dependency structure; Hard failure time; Reliability function

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