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Constructing a production exception handling system for the semiconductor manufacturing process

Constructing a production exception handling system for the semiconductor manufacturing process Purpose – Facing keen worldwide competition, it is not enough for companies to pursue customer satisfaction; they must actively pursue customer delight. This paper seeks to design a work‐in‐process (WIP) exception handling system (WIPEHS) not simply measuring on‐time delivery performance for managers to take necessary improvement activities. It helps managers detect abnormal WIP levels in advance, trigger rectifying actions and finally notify pertinent people to coordinate roots causes and preventive means. Design/methodology/approach – The structure of WIPEHS is proposed and then constructed with a soft package, Vigilance. A typical semiconductor factory is built and production data are simulated to evaluate the effectiveness of WIPEHS. Findings – Collecting and analyzing results from the simulated typical semiconductor factory, the paper finds that the proposed system can effectively improve on‐time delivery performance; and that durations from a WIP exception detected a WIP exception back to normal and durations between two successive WIP exceptions significantly. Practical implications – It helps factories outperform due dates, achieving significantly higher performance than prior performance without the production exception handling system, which should greatly please customers. Originality/value – The proposed WIPEHS provide a total solution for undesirable production variations potentially harmful to due‐date performance. It anticipates WIP exception, notifies pertinent recipients, tracks the progress of exception resolution, and provides a forum for discussion of the root causes. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Kybernetes Emerald Publishing

Constructing a production exception handling system for the semiconductor manufacturing process

Tsu‐Ming Yeh
Kybernetes , Volume 40 (9/10): 13 – Oct 18, 2011
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Publisher
Emerald Publishing
Copyright
Copyright © 2011 Emerald Group Publishing Limited. All rights reserved.
ISSN
0368-492X
DOI
10.1108/03684921111169549
Publisher site
See Article on Publisher Site

Abstract

Purpose – Facing keen worldwide competition, it is not enough for companies to pursue customer satisfaction; they must actively pursue customer delight. This paper seeks to design a work‐in‐process (WIP) exception handling system (WIPEHS) not simply measuring on‐time delivery performance for managers to take necessary improvement activities. It helps managers detect abnormal WIP levels in advance, trigger rectifying actions and finally notify pertinent people to coordinate roots causes and preventive means. Design/methodology/approach – The structure of WIPEHS is proposed and then constructed with a soft package, Vigilance. A typical semiconductor factory is built and production data are simulated to evaluate the effectiveness of WIPEHS. Findings – Collecting and analyzing results from the simulated typical semiconductor factory, the paper finds that the proposed system can effectively improve on‐time delivery performance; and that durations from a WIP exception detected a WIP exception back to normal and durations between two successive WIP exceptions significantly. Practical implications – It helps factories outperform due dates, achieving significantly higher performance than prior performance without the production exception handling system, which should greatly please customers. Originality/value – The proposed WIPEHS provide a total solution for undesirable production variations potentially harmful to due‐date performance. It anticipates WIP exception, notifies pertinent recipients, tracks the progress of exception resolution, and provides a forum for discussion of the root causes.

Journal

Kybernetes – Emerald Publishing

Published: Oct 18, 2011

Keywords: Cybernetics; Semiconductors; WIP management; Due‐date performance

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