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Characterisation of Thin Film Superconductors by Magnetically Modulated Resistance

Characterisation of Thin Film Superconductors by Magnetically Modulated Resistance It is of practical importance to measure and control the morphological state of thin film superconductors. Properties such as critical current, magnetic response and high frequency response are significantly affected by the microstructure of granular thin film specimens. A simple and functional method, magnetically modulated resistance, is described for assessing the granularity of superconductors. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Microelectronics International Emerald Publishing

Characterisation of Thin Film Superconductors by Magnetically Modulated Resistance

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References (4)

Publisher
Emerald Publishing
Copyright
Copyright © Emerald Group Publishing Limited
ISSN
1356-5362
DOI
10.1108/eb044433
Publisher site
See Article on Publisher Site

Abstract

It is of practical importance to measure and control the morphological state of thin film superconductors. Properties such as critical current, magnetic response and high frequency response are significantly affected by the microstructure of granular thin film specimens. A simple and functional method, magnetically modulated resistance, is described for assessing the granularity of superconductors.

Journal

Microelectronics InternationalEmerald Publishing

Published: Jan 1, 1991

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