Access the full text.
Sign up today, get DeepDyve free for 14 days.
Recently great interest has developed for a high speed, flexible machine vision system which can accurately determine solder paste and component placement for both process verification and quality control inspection. Present SMT inspection systems must cope with the unpredictable appearance of components and backgrounds and are often used only to determine presence and absence. This paper describes a new approach which combines greyscale data with a threedimensional map of the board under test. Originally this method was proposed as a robust technique for locating components in low contrast greyscale images. However, experience working with manufacturers and developers of placement equipment has shown that emerging SMT inspection requirements indicate the importance of threedimensional information. In addition to the detection of components and measurement of orientation, examples are shown of solder paste volume measurements, lead coplanarity, and tombstone effect detection.
Microelectronics International – Emerald Publishing
Published: Feb 1, 1987
Read and print from thousands of top scholarly journals.
Already have an account? Log in
Bookmark this article. You can see your Bookmarks on your DeepDyve Library.
To save an article, log in first, or sign up for a DeepDyve account if you don’t already have one.
Copy and paste the desired citation format or use the link below to download a file formatted for EndNote
Access the full text.
Sign up today, get DeepDyve free for 14 days.
All DeepDyve websites use cookies to improve your online experience. They were placed on your computer when you launched this website. You can change your cookie settings through your browser.