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Analyzing distortion contributions in a complex device model

Analyzing distortion contributions in a complex device model Purpose – The purpose of this paper is to propose a method to reduce the non‐linear distortion of a transistor to its input and output ports to aid distortion contribution analysis (DCA). This is especially needed when the internal structure of a device model is complex. Design/methodology/approach – The non‐linear distortion generated by all non‐linear sources inside a device model are reduced to transistor i/o ports by LMSE fitting techniques. Simulations of an LDMOS power transistor are used to compare the reduced distortion results with the actual non‐linear sources. Findings – It is shown, that device models where the current sources are split by intermediate nodes cause superficial results, when distortion contributions are calculated as a superposition of contributions from individual non‐linear sources. The proposed iterative fitting technique works. Research limitations/implications – Some non‐quasistatic effects and the transfer functions from external terminals to internal controlling nodes are not covered. Practical implications – The analysis is a step toward a generic non‐linear distortion contribution simulation tool that would aid the designers to develop more linear analog circuits. Originality/value – The concept of DCA itself is fairly new. This paper makes a step to represent the distortion sources in a canonical way. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering Emerald Publishing

Analyzing distortion contributions in a complex device model

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Publisher
Emerald Publishing
Copyright
Copyright © 2014 Emerald Group Publishing Limited. All rights reserved.
ISSN
0332-1649
DOI
10.1108/COMPEL-11-2012-0354
Publisher site
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Abstract

Purpose – The purpose of this paper is to propose a method to reduce the non‐linear distortion of a transistor to its input and output ports to aid distortion contribution analysis (DCA). This is especially needed when the internal structure of a device model is complex. Design/methodology/approach – The non‐linear distortion generated by all non‐linear sources inside a device model are reduced to transistor i/o ports by LMSE fitting techniques. Simulations of an LDMOS power transistor are used to compare the reduced distortion results with the actual non‐linear sources. Findings – It is shown, that device models where the current sources are split by intermediate nodes cause superficial results, when distortion contributions are calculated as a superposition of contributions from individual non‐linear sources. The proposed iterative fitting technique works. Research limitations/implications – Some non‐quasistatic effects and the transfer functions from external terminals to internal controlling nodes are not covered. Practical implications – The analysis is a step toward a generic non‐linear distortion contribution simulation tool that would aid the designers to develop more linear analog circuits. Originality/value – The concept of DCA itself is fairly new. This paper makes a step to represent the distortion sources in a canonical way.

Journal

COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering – Emerald Publishing

Published: Jul 1, 2014

Keywords: Algorithms; Computer aided design; Electrical circuits; Circuit analysis

References

  • Utilization of distortion contribution analysis
    Aikio, J.; Rahkonen, T.
  • Detailed distortion analysis technique based on large‐signal voltage and current spectra
    Aikio, J.P.; Rahkonen, T.
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    Hooke, R.; Jeeves, T.A.
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    Maas, S.
  • Motorola's Electrothermal (MET) LDMOS model
    Motorola
  • Distortion in Power Amplifiers
    Vuolevi, J.; Rahkonen, T.
  • Distortion Analysis of Analog Integrated Circuits
    Wambacq, P.; Sansen, W.M.C.
  • Linear least squares (mathematics)
    Wikipedia
  • On the modeling of LDMOS RF power transistors
    Wood, J.; Aaen, P.H.