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A new method for measuring signal integrity in CMOS ICs

A new method for measuring signal integrity in CMOS ICs The aim of this paper is to present a new and original method for onchip measurements of very high frequency parasitic signals where a sampling circuit is directly included in the test chip. The paper describes the usefulness of this sensor for measuring signal propagation and crosstalk glitch on integrated circuit interconnects and also gives the results obtained experimentally. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Microelectronics International Emerald Publishing

A new method for measuring signal integrity in CMOS ICs

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Publisher
Emerald Publishing
Copyright
Copyright © Emerald Group Publishing Limited
ISSN
1356-5362
DOI
10.1108/13565360010305886
Publisher site
See Article on Publisher Site

Abstract

The aim of this paper is to present a new and original method for onchip measurements of very high frequency parasitic signals where a sampling circuit is directly included in the test chip. The paper describes the usefulness of this sensor for measuring signal propagation and crosstalk glitch on integrated circuit interconnects and also gives the results obtained experimentally.

Journal

Microelectronics International – Emerald Publishing

Published: Apr 1, 2000

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