Influence of bias humidity testing and application on time-dependent, Arrhenius-law-based stability predictions for thin film resistors

Influence of bias humidity testing and application on time-dependent, Arrhenius-law-based... 1 Introduction</h5> Drift prognoses under dry heat conditions in the relevant temperature–time-expanse up to 175 °C have been shown in a previous paper [1] . The main finding was the phenomena of time dependence of the derived Arrhenius laws and the process constant T stab . Prognosis models based on the time-dependent Arrhenius equation can ensure safe and reliable operation with a prognosis of >200,000 h or >20 years [2] .</P>The automotive industry requires further reliability targets for applications under very critical worst-case environmental conditions. Biased 85 °C/85% RH tests became obligatory for the qualification and release of passive components [3] , in addition to the 40 °C/93% RH test, which has been standard for many years [4] . Especially for passive components, detailed interactions and degradation mechanisms are quite unknown. Therefore at workshops and conferences, component manufacturers claim that the 85/85 test is too harsh for their special component (Examples: AEC-RW 2012: Polymer-C; AEC-RW 2008: Tantalum-C – after 168 h of 85/85 testing).</P>The automotive industry has no clear idea what 85/85 compliance would mean for the long term (e.g. a product life of 17 years and 5000–7000 h under voltage). Therefore questions and requests have arisen concerning http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Microelectronics Reliability Elsevier

Influence of bias humidity testing and application on time-dependent, Arrhenius-law-based stability predictions for thin film resistors

Microelectronics Reliability, Volume 54 (6) – Jun 1, 2014

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Publisher
Elsevier
Copyright
Copyright © 2014 Elsevier Ltd
ISSN
0026-2714
eISSN
1872-941X
D.O.I.
10.1016/j.microrel.2014.02.027
Publisher site
See Article on Publisher Site

Abstract

1 Introduction</h5> Drift prognoses under dry heat conditions in the relevant temperature–time-expanse up to 175 °C have been shown in a previous paper [1] . The main finding was the phenomena of time dependence of the derived Arrhenius laws and the process constant T stab . Prognosis models based on the time-dependent Arrhenius equation can ensure safe and reliable operation with a prognosis of >200,000 h or >20 years [2] .</P>The automotive industry requires further reliability targets for applications under very critical worst-case environmental conditions. Biased 85 °C/85% RH tests became obligatory for the qualification and release of passive components [3] , in addition to the 40 °C/93% RH test, which has been standard for many years [4] . Especially for passive components, detailed interactions and degradation mechanisms are quite unknown. Therefore at workshops and conferences, component manufacturers claim that the 85/85 test is too harsh for their special component (Examples: AEC-RW 2012: Polymer-C; AEC-RW 2008: Tantalum-C – after 168 h of 85/85 testing).</P>The automotive industry has no clear idea what 85/85 compliance would mean for the long term (e.g. a product life of 17 years and 5000–7000 h under voltage). Therefore questions and requests have arisen concerning

Journal

Microelectronics ReliabilityElsevier

Published: Jun 1, 2014

References

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