Microscale Full In-plane Strain Tensor (FIST) analysis is crucial for improving understanding of residual stress and mechanical failure in many applications. This study outlines the first Focused Ion Beam (FIB) milling and Digital Image Correlation (DIC) based technique capable of performing precise, reliable and rapid quantification of this behaviour. The nature of semi-destructive FIB milling overcomes the main limitations of X-Ray Diffraction (XRD) strain tensor quantification: unstrained lattice parameter estimates are not required, analysis is performed in within a precisely defined 3D microscale volume, both amorphous and crystalline materials can be studied and access to X-ray/neutron facilities is not required.The FIST FIB milling and DIC experimental technique is based on extending the ring-core milling geometry to quantify the strain variation with angle and therefore benefits from the excellent precision and simple analytical approach associated with this method. In this study in-plane strain analysis was performed on sample of commercial interest: a porcelain veneered Yttria Partially Stabilised Zirconia (YPSZ) dental prosthesis, and was compared with the results of XRD.The two methods sample different gauge volumes and mechanical states: approximately plane stress for ring-core milling, and a through-thickness average for XRD. We demonstrate using complex analysis methods and Finite Element (FE) modelling that valid comparisons can be drawn between these two stress states. Excellent agreement was obtained between principal stress orientation and magnitudes, leading to realistic residual stress estimates that agree well with the literature (σAv≈460MPa). As a measure of validity of the matching approach we report the upper and lower bounds on the (101) interplanar spacing of YPSZ that are found to correspond to the range 2.9586−2.9596Å, closely matching published values.
Journal of the Mechanics and Physics of Solids – Elsevier
Published: Sep 1, 2016
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