Enhanced strength and ductility of bulk CoCrFeMnNi high entropy alloy having fully recrystallized ultrafine-grained structure

Enhanced strength and ductility of bulk CoCrFeMnNi high entropy alloy having fully recrystallized... A high efficient magnetic levitation melting technique was reported for fabricating bulk equiatomic CoCrFeMnNi high-entropy alloy (HEA) ingot with a diameter of 110mm. The bulk ingot can be either forged or rolled. In particular, fully recrystallized ultrafine-grained (UFG) HEA with a minimum grain size of 503±181nm was successfully obtained through a simple cold rolling and annealing process. The tensile properties of the HEA were studied by changing the grain size from the UFG regime to the coarse-grained regime. The UFG HEA exhibited a good balance of strength and ductility due to the low stacking fault energy. The linear Hall-Petch relationship was well fitted when the grain sizes range from 503nm to 88.9μm. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Materials & design Elsevier

Enhanced strength and ductility of bulk CoCrFeMnNi high entropy alloy having fully recrystallized ultrafine-grained structure

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Publisher
Elsevier
Copyright
Copyright © 2017 Elsevier Ltd
ISSN
0264-1275
eISSN
0141-5530
D.O.I.
10.1016/j.matdes.2017.07.054
Publisher site
See Article on Publisher Site

Abstract

A high efficient magnetic levitation melting technique was reported for fabricating bulk equiatomic CoCrFeMnNi high-entropy alloy (HEA) ingot with a diameter of 110mm. The bulk ingot can be either forged or rolled. In particular, fully recrystallized ultrafine-grained (UFG) HEA with a minimum grain size of 503±181nm was successfully obtained through a simple cold rolling and annealing process. The tensile properties of the HEA were studied by changing the grain size from the UFG regime to the coarse-grained regime. The UFG HEA exhibited a good balance of strength and ductility due to the low stacking fault energy. The linear Hall-Petch relationship was well fitted when the grain sizes range from 503nm to 88.9μm.

Journal

Materials & designElsevier

Published: Nov 5, 2017

References

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