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XDS

XDS The usage and control of recent modifications of the program package XDS for the processing of rotation images are described in the context of previous versions. New features include automatic determination of spot size and reflecting range and recognition and assignment of crystal symmetry. Moreover, the limitations of earlier package versions on the number of correction/scaling factors and the representation of pixel contents have been removed. Large program parts have been restructured for parallel processing so that the quality and completeness of collected data can be assessed soon after measurement. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Acta Crystallographica Section D Wiley

XDS

Kabsch, Wolfgang
Acta Crystallographica Section D , Volume 66 (2) – Feb 1, 2010
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References (4)

Publisher
Wiley
Copyright
? Kabsch 2010
ISSN
1399-0047
eISSN
1399-0047
DOI
10.1107/S0907444909047337
pmid
20124692
Publisher site
See Article on Publisher Site

Abstract

The usage and control of recent modifications of the program package XDS for the processing of rotation images are described in the context of previous versions. New features include automatic determination of spot size and reflecting range and recognition and assignment of crystal symmetry. Moreover, the limitations of earlier package versions on the number of correction/scaling factors and the representation of pixel contents have been removed. Large program parts have been restructured for parallel processing so that the quality and completeness of collected data can be assessed soon after measurement.

Journal

Acta Crystallographica Section D – Wiley

Published: Feb 1, 2010

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