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- Publisher
- Wiley
- Copyright
- Copyright © 1981 Wiley Subscription Services, Inc., A Wiley Company
- ISSN
- 0022-2720
- eISSN
- 1365-2818
- DOI
- 10.1111/j.1365-2818.1981.tb01267.x
- Publisher site
- See Article on Publisher Site
Abstract
A method is described for measuring the mass/length or mass of molecular assemblies by comparative electron scattering in the STEM. Standard particles whose mass is well established (e.g. TMV or fd bacteriophage) are deposited on the electron microscope grid together with the sample to be measured. Images containing at least one sample and standard and with a clean, contamination‐free background are chosen and stored on computer disc and then directly integrated. Use of a comparative technique does not require accurate determination of scattering parameters or instrumental geometry and requires only that the limits of linearity be established.
Journal
Journal of Microscopy – Wiley
Published: Jun 1, 1981