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On the reliability of majority logic structure in quantum-dot cellular automata

Sen, Bibhash; Sahu, Yashraj; Mukherjee, Rijoy; Nath, Rajdeep Kumar; Sikdar, Biplab K.

Microelectronics Journal , Volume 47: 7-18 – Jan 1, 2016

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On the reliability of majority logic structure in quantum-dot cellular automata

Sen, Bibhash; Sahu, Yashraj; Mukherjee, Rijoy; Nath, Rajdeep Kumar; Sikdar, Biplab K.

Microelectronics Journal , Volume 47: 7-18 – Jan 1, 2016

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Publisher: CrossRef
Copyright: Copyright © 2015 Elsevier Ltd. All rights reserved.
ISSN: 0026-2692
DOI: 10.1016/j.mejo.2015.11.002
Publisher site: See Article on Publisher Site

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