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We are developing a Scanning Beam Interference Lithography (SBIL) system . SBIL represents a new paradigm in semiconductor metrology , capable of patterning large-area linear gratings and grids ...
an independent CNT for the tip of a scanning probe microscope. Indeed, the use of an independent CNT tip for metrology of large-scale integration (LSI) was suggested [1]. When the half-pitch of the line-and-space ...
for the system was fabricated in-house and operated under a closed-loop stepper-motor control with < 5 μm precision. For each scan , 360 images were acquired at 1° angular increments. The stage was placed 300 mm ...
). 2.3 Check that the beam scan system causes the beam to traverse over the sample while maintaining a fixed angle (usually nearly perpendicular, to minimize aberrations) to the imaging plane ...
must be detected. By scanning a probe beam across a resonance condition and then detecting the MOT fluorescence, the authors were able to monitor the population transfer from the ground level ...
). The beam surface had an area of 0.5 m2. The inspection tool-paths were raster scans with a raster step of 29.4 mm, equal to the width of the ultrasonic phased array probe active area. Fig. 13 Open in new ...
temperature, and 65% humidity. XRCT scanning and harvesting of shoots, roots, and rhizosphere The planted columns were scanned using an industrial μCT system (X-TEK XTH 225, Nikon Metrology ) at 160 kV, 296 μA ...
consisting of a split-coil magnet (Magnex/Agilent, Oxford, UK) and an NMR imaging spectrometer (Varian/Agilent, Alto Palo, USA). The split between the magnet halves is 50 cm. A ditch with an elevator system ...
samples were conditioned at 20 °C and 65% RH for 14 days and scanned again. Reconstruction was performed using Octopus, a tomography reconstruction package for parallel, helical and cone beam geometry ...
{equation} (3.2) where |Ψ(t)〉 is the quantum state of the system at time t and |Ψ(0)〉 is the initial state where t = 0. H(t) is a time-dependent Hamiltonian of the system controlling the evolution. For each H ...
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