Optimized entropic uncertainty for successive projective measurements

Optimized entropic uncertainty for successive projective measurements We focus here on the uncertainty of an observable Y caused by a precise measurement of X . We illustrate the effect by analyzing the general scenario of two successive measurements of spin components X and Y . We derive an optimized entropic uncertainty limit that quantifies the necessary amount of uncertainty observed in a subsequent measurement of Y . We compare this bound to recently derived error-disturbance relations and discuss how the bound quantifies the information of successive quantum measurements. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Physical Review A American Physical Society (APS)

Optimized entropic uncertainty for successive projective measurements

Physical Review A, Volume 89 (3): 6 – Mar 10, 2014
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Publisher
American Physical Society (APS)
Copyright
©2014 American Physical Society
Subject
ARTICLES; Fundamental concepts
ISSN
1050-2947
eISSN
1094-1622
D.O.I.
10.1103/PhysRevA.89.032108
Publisher site
See Article on Publisher Site

Abstract

We focus here on the uncertainty of an observable Y caused by a precise measurement of X . We illustrate the effect by analyzing the general scenario of two successive measurements of spin components X and Y . We derive an optimized entropic uncertainty limit that quantifies the necessary amount of uncertainty observed in a subsequent measurement of Y . We compare this bound to recently derived error-disturbance relations and discuss how the bound quantifies the information of successive quantum measurements.

Journal

Physical Review AAmerican Physical Society (APS)

Published: Mar 10, 2014

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