%0 Journal Article
%T Fabric defect detection based on sparse representation of main local binary pattern
%A Liu, Zhoufeng
%A Yan, Lei
%A Li, Chunlei
%A Dong, Yan
%A Gao, Guangshuai
%J International Journal of Clothing Science and Technology
%V 29
%N 3
%P 282-293
%@ 0955-6222
%D 2017-06-05
%I Emerald Group Publishing Limited
%~ DeepDyve