%0 Journal Article %T Simulation of the local effect of nuclear particles on 65-nm CMOS DICE memory cells %A Stenin, V. %A Stepanov, P. %J Russian Microelectronics %V 41 %N 4 %P 231-238 %@ 1063-7397 %D 2012-07-12 %I SP MAIK Nauka/Interperiodica %~ DeepDyve