%0 Journal Article
%T Simulation of the local effect of nuclear particles on 65-nm CMOS DICE memory cells
%A Stenin, V.
%A Stepanov, P.
%J Russian Microelectronics
$V 41
%N 4
%P 231-238
%@ 1063-7397
%D 2012
%I SP MAIK Nauka/Interperiodica