TY - JOUR
AU1 - Vaknin, A.
AU2 - Ovadyahu, Z.
AU3 - Pollak, M.
AB - We report observations of glass behavior of an electronic system in an Anderson insulator. The system used is a MOSFET‐like structure with a thin film of In2O3—x serving as the active element. The glassy behavior is reflected as a local minimum at the ‘cool‐down’ gate voltage in the conductance vs. gate‐voltage, G(Vg) sweeps. Relaxation is monitored as a function of temperature and film disorder. Studying certain features of the G(Vg) minima reveals that interactions are important in the relaxation process.
TI - Non‐Equilibrium Transport in Anderson Insulators
JF - Physica Status Solidi (B) Basic Solid State Physics
DO - 10.1002/(SICI)1521-3951(199801)205:1<395::AID-PSSB395>3.0.CO;2-C
DA - 1998-01-01
UR - https://www.deepdyve.com/lp/wiley/non-equilibrium-transport-in-anderson-insulators-zOA4BEYWv0
SP - 395
EP - 398
VL - 205
IS - 1
DP - DeepDyve
ER -