TY - JOUR
AU - Tikhonov, R.
AB - The distribution of recombination rate in a dual-collector lateral bipolar magnetotransistor fabricated from a diffused well is investigated by computer simulation. The significance of bulk recombination in negative relative sensitivity is assessed by analyzing carrier transport at low-level injection.
TI - The Bulk-Recombination Mechanism of Negative Relative Sensitivity Observed in Bipolar Magnetotransistors
JO - Russian Microelectronics
DO - 10.1023/B:RUMI.0000046968.70902.e2
DA - 2004-11-19
UR - https://www.deepdyve.com/lp/springer-journals/the-bulk-recombination-mechanism-of-negative-relative-sensitivity-xSsiIx7Fxd
SP - 377
EP - 380
VL - 33
IS - 6
DP - DeepDyve
ER -