TY - JOUR
AU - 
AB - Indium Oxide thin layers were deposited on microscope glass substrates by chemical bath deposition technique from aqueous solutions containing indium chloride and NH at 70 and 900C as deposition temperature. Aqueous solution heated for about 45 minutes and kept at 2.5pH. The effects of temperature toward the properties of the thin layers were investigated. The deposited thin layers were characterized with X-ray Diffraction and Scanning Electron Microscopy analysis. Keywords: Chemical Bath Deposition, Indium Oxide, SEM, Structural Properties, XRD Chemical Bath (CBD) prepared from Indium chloride, 1. Introduction NH and distilled water. e Th deposition bath was continu - Transparent Oxide Semiconductors (TOSs) are currently ously stirred, heated for about 40 minutes. e Th substrates were immersed into the deposition bath, by vertically being explored as i Th n Film Transistor (TFT) materials, an enabling technology for then extenuation of comput- suspending them around the stirrer. e Th solution heated 1,2 at 70 and 900C as deposition temperatures. Deposition ing, communication and identification devices . Indium -3 Oxide (In O ) has been investigated extensively for its parameters were: [Indium chloride] = 3x10 M; [NH ] = 2 3 -1 3x10 M; pH = 2.5. All samples were annealed in 
TI - Effects of Temperature on Structural Properties of Indium Oxide Thin Layers Produced by CBD Method
JF - Indian Journal of Science and Technology
DO - 10.17485/ijst/2015/v8i35/85918
DA - 2015-12-03
UR - https://www.deepdyve.com/lp/unpaywall/effects-of-temperature-on-structural-properties-of-indium-oxide-thin-onK5TUR5fT
DP - DeepDyve
ER -