TY - JOUR
AU - Chambers, J
AB - The manual method of measuring applied voltages and corresponding emission currents for the Fowler-Nordheim plot in field emission microscopy is tedious. A technique has been devised which not only measures enough data for a Fowler-Nordheim plot in 1.2 sec, but also presents it in a form suitable for direct calculation in a digital computer. The method is fast enough for measuring the change in work function of an emitter tip as metal atoms diffuse across its surface.
TI - The fast recording of data for Fowler-Nordheim plots in field emission microscopy
JF - Journal of Scientific Instruments
DO - 10.1088/0950-7671/44/12/433
DA - 1967-12-01
UR - https://www.deepdyve.com/lp/iop-publishing/the-fast-recording-of-data-for-fowler-nordheim-plots-in-field-emission-o5NyKnfBgv
SP - 1051
VL - 44
IS - 12
DP - DeepDyve
ER -