TY - JOUR AU - Trela, W. J. AB - There is a great interest in the application of thin film multilayer structures for x�ray optical elements. We have developed aparatus and techniques to measure the reflectivity of multilayer structures on flat substrates a function of energy at angles from grazing to near normal incidence using a synchrotron. We will present descriptions of our measurement techniques and aparatus along with a comparison between theoretical calculations and experimental data. TI - Synchrotron Based Measurements Of The Soft X-Rayperformance Of Thin Film Multilayer Structures JF - Proceedings of SPIE DO - 10.1117/12.949670 DA - 1985-08-06 UR - https://www.deepdyve.com/lp/spie/synchrotron-based-measurements-of-the-soft-x-rayperformance-of-thin-kwpfKPJIIB SP - 216 EP - 220 VL - 563 IS - DP - DeepDyve ER -