TY - JOUR
AU1 - Carletta, Joan
AU2 - Papachristou, Christos
AB - A method for test synthesis in the behavioral domain is described.The approach is based on the notion of adding a test behavior to the normal-mode design behavior. This testbehavior describes the behavior of the design in test mode. Thenormal-mode design behavior and test-mode test behavior are combinedand then synthesized by any general-purpose synthesis system toproduce a testable design with inserted BIST structures. The testbehavior is derived from the design behavior using testabilityanalysis based on metrics that quantify the testability of signalsand variables embedded within behaviors. The insertion method iscombined with a behavioral test scheme thatintegrates a) the design controller and test controller, b) testingof the entire datapath and controller. Examples show that when thetestability insertion procedure is used to modify a behavior beforesynthesis, the resulting synthesized physical implementation isindeed more easily tested than an implementation synthesized directlyfrom the original behavior.
TI - Behavioral Testability Insertion for Datapath/Controller Circuits
JF - Journal of Electronic Testing
DO - 10.1023/A:1008291616071
DA - 2004-09-10
UR - https://www.deepdyve.com/lp/springer-journals/behavioral-testability-insertion-for-datapath-controller-circuits-gv9msxD5uy
SP - 9
EP - 28
VL - 11
IS - 1
DP - DeepDyve
ER -