TY - JOUR
AU - Forbes, Richard G.
AB - Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography. Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy. The fundamental underlying physics principles are examined, in addition to data reconstruction and visualization, statistical data analysis methods and specimen preparation by electropolishing and FIB-based techniques. A full description of the local electrode atom probe – a new state-of-the-art instrument – is also provided, along with detailed descriptions and limitations of laser pulsing as a method to field evaporate atoms. Valuable coverage of the new ionization theory is also included, which underpins the overall technique. ; In this comprehensive introduction to the use of APT in nanocharacterization, readers will find everything they need to get up to speed on the technique, from the core physics to state-of-the-art instrumentation and revised methods of data analysis. ; Introduction to Atom Probe Tomography.- Introduction to the Physics of Field Ion Emitters.- Field Evaporation and Related Topics.- The Art of Specimen Preparation.- The Local Electrode Atom Probe.- Data Reconstruction.- Data Analysis.- Appendices. ; This book aims to provide an introduction and overview of atom-probe tomography from a materials science perspective, a full introduction to underlying theory and to current understanding of the theory of laser-pulsed APT, and a careful account of how to prepare specimens, set up the appropriate conditions for tomography, analyse the experimental data, and present results. A special feature of this book is that it includes an updated historical account of the development of the underlying theory (including field evaporation), allowing readers to appreciate how theoretical understanding of the science behind the technique reached its present state. This book is ideal for: · beginners as well as more experienced researchers and scientists · those interested mainly in using the pulsed-laser local electrode atom probe for materials science · those interested in developing the technique and understanding the details of how it works ; Serves as a practical guide for the operation of the technique and analysis of the data Covers state-of-the-art instrumentation and theories Includes new and revised data analysis methods and applications ; US
TI - Atom-Probe Tomography The Local Electrode Atom Probe
DA - 2014-07-31
UR - https://www.deepdyve.com/lp/springer-e-books/atom-probe-tomography-the-local-electrode-atom-probe-gb9OlBwNXh
DP - DeepDyve
ER -