TY - JOUR
AU1 - Mizuta, Takahisa
AU2 - Jung, K. S.
AU3 - Oh, T. S.
AU4 - Cho, Y. H.
AU5 - Pyun, D. H.
AB - A new evaluation method of the Inner Pin Distortion (IPD) has been developed. As the method does not require any displayed line on cathode ray tubes (CRTs), it can be commonly used by measurement and simulation. And the dependency of the IPD to CRTs inner curvature becomes clear by simulating
TI - 36.3: New Evaluation Method for the Inner Pin Distortion Problem of CRTs
JF - Sid Symposium Digest of Technical Papers
DO - 10.1889/1.1831729
DA - 2001-06-01
UR - https://www.deepdyve.com/lp/wiley/36-3-new-evaluation-method-for-the-inner-pin-distortion-problem-of-ebMqUnXU5i
SP - 1012
VL - 32
IS - 1
DP - DeepDyve
ER -