TY - JOUR
AU - Taksis, G.
AB - APPARATUS FOR SIMULTANEOUSLY RECORDING X-RAY DIFFRACTION PATTERNS, THERMOGRAMS, AND ELECTRICAL RESISTANCE CURVES OF SOLID MATERIALS AT HIGH TEMPERATURES A. F. Bessonov, V. M. Ust'yantsev, and G. A. Taksis High-temperature tests are necessaryin research on various problems connected with solid mater- ials -on their properties, use in the manufacture of certain articles, behavior in service, internal pro- cesses, etc. Important roles are played by x-ray and thermographic methods and electrical resistance measurements [1-3]. By our new method of high-temperature x-ray diffraction we can find not only the phase composition of the initial or final products, but also detect intermediate phases and study the kinetics of their forma- tion and disappearance. Most physical and chemical processes are accompanied by the emission or ab- sorption of heat. Such processes can in turn be studied by means of temperature measurements-the wide- ly-used method of "thermal analysis'. In this method the furnace temperature is varied at a uniform rate and the temperature of the substance continuously monitored, and thus we obtain a record of the reactions at any temperatures from deviations from smoothness of the heating or cooling curves. From the form and magnitude of the deviations we can judge whether the reactions are 
TI - Apparatus for simultaneously recording X-ray diffraction patterns, thermograms, and electrical resistance curves of solid materials at high temperatures
JO - Powder Metallurgy and Metal Ceramics
DO - 10.1007/BF00775674
DA - 2004-11-24
UR - https://www.deepdyve.com/lp/springer-journals/apparatus-for-simultaneously-recording-x-ray-diffraction-patterns-e56J58lsVa
SP - 238
EP - 240
VL - 6
IS - 3
DP - DeepDyve
ER -