TY - JOUR
AU - Ramasamy, S.
AB - Waveform digitizer, the soul of readout electronics in the   radiation detectors performing a multitude of functions has to evade   the impact of single-event transients in its timing reference. The   propagation of transients from the timing generator to the analog   memory causes timing non-linearity due to variation in the inverter   delay responsible for the sampling speed leading to catastrophic   failure of the waveform sampler. The presented timing generator   using mixed-signal delay-locked loop implements the triple   combination of the body-feed technique allowing rail-to-rail   operation for delay control, the pseudo differential structure   regulating duty cycle reduces the jitter and also optimize the   linear operating range of the voltage-controlled-delay-line, and the   mixed-signal delay-locked loop embedded with dual-edge   synchronization enhances the mitigation of single-event upsets. The   simulation results at the circuit level using 180 nm and 90 nm   CMOS PDKs show a 28% increase in the linear operating range and   bettering jitter performance of the mixed-signal delay-locked loop   in comparison to the fully differential   voltage-controlled-delay-line based delay-locked loop. Furthermore,   there is only negligible variance between the irradiated and   non-irradiated values for delay interval of each sampling cell and   cell-to-cell gain variation in the analog memory of the waveform   sampler.
TI - Single-Event-Hardened Timing Generator for waveform digitizer based readout electronics
JF - Journal of Instrumentation
DO - 10.1088/1748-0221/14/06/C06021
DA - 2019-06-21
UR - https://www.deepdyve.com/lp/iop-publishing/single-event-hardened-timing-generator-for-waveform-digitizer-based-e0S5A83knY
SP - C06021
EP - C06021
VL - 14
IS - 06
DP - DeepDyve
ER -