TY - JOUR
AU1 - Efrat, Ilan
AU2 - Israeli, Moshe
AB - State of the art programs for the solution of the drift diffusion semiconductor equations are based on finite difference techniques, or on certain combinations of finite elements and finite differences. The extreme gradients which occur in semiconductor devices have motivated several attempts to exploit perturbation analysis in order to improve the numerical scheme. Selberherr, Markowich et. al. showed the singular perturbation nature of the drift diffusion equations. Their analytic approximations of diodes influenced some aspects of the Minimos and Bambi simulators. Asymptotic analyses of MOSFET were presented by Brews and by Ward. These solutions are mainly valid for long channels, and their accuracy is limited.
TI - A HYBRID SOLUTION OF THE SEMICONDUCTOR DEVICE EQUATIONS
JF - COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering
DO - 10.1108/eb051700
DA - 1991-04-01
UR - https://www.deepdyve.com/lp/emerald-publishing/a-hybrid-solution-of-the-semiconductor-device-equations-ctrt0k0ox0
SP - 215
EP - 229
VL - 10
IS - 4
DP - DeepDyve
ER -