TY - JOUR
AU - Parsons, Ron
AB - The arguments for and against burn‐in are discussed. Conclusions are made on likely future requirements for burn‐in systems for integrated circuits.
TI - Semiconductor device burn‐in, is there a future?
JF - Quality and Reliability Engineering International
DO - 10.1002/qre.4680020408
DA - 1986-01-01
UR - https://www.deepdyve.com/lp/wiley/semiconductor-device-burn-in-is-there-a-future-aMItAViFKh
SP - 255
EP - 258
VL - 2
IS - 4
DP - DeepDyve
ER -