TY - JOUR
AU - Henriksen, L
AB - An electron optical method for determining defocusing distances and magnifications in Lorentz electron microscopy is described and the use of the field limiting aperture as specimen holder is shown to give high resolution.
TI - Defocusing distances, magnifications and high resolution in Lorentz electron microscopy
JF - Journal of Physics E: Scientific Instruments
DO - 10.1088/0022-3735/4/12/053
DA - 1971-12-01
UR - https://www.deepdyve.com/lp/iop-publishing/defocusing-distances-magnifications-and-high-resolution-in-lorentz-YA9PbtL095
SP - 1079
VL - 4
IS - 12
DP - DeepDyve
ER -