TY - JOUR
AU - 
AB - www.acsami.org Research Article Holistic Variability Analysis in Resistive Switching Memories Using a Two-Dimensional Variability Coefficient Christian Acal, David Maldonado, Ana M. Aguilera, Kaichen Zhu, Mario Lanza,* and Juan Bautista Roldán* Cite This: ACS Appl. Mater. Interfaces 2023, 15, 19102−19110 Read Online Metrics & More Article Recommendations * sı Supporting Information ACCESS ABSTRACT: We present a new methodology to quantify the variability of resistive switching memories. Instead of statistically analyzing few data points extracted from current versus voltage (I− V) plots, such as switching voltages or state resistances, we take into account the whole I−V curve measured in each RS cycle. This means going from a one-dimensional data set to a two-dimensional data set, in which every point of each I−V curve measured is included in the variability calculation. We introduce a new coefficient (named two-dimensional variability coefficient, 2DVC) that reveals additional variability information to which traditional one-dimensional analytical methods (such as the coefficient of variation) are blind. This novel approach provides a holistic variability metric for a better understanding of the functioning of resistive switching memories. KEYWORDS: resistive memories, variability, variability coefficient, functional data analysis, holistic methodology 1. INTRODUCTION Although the resistive memories are being incorporated at the industrial 
TI - Holistic Variability Analysis in Resistive Switching Memories Using a Two-Dimensional Variability Coefficient
JF - ACS Applied Materials & Interfaces
DO - 10.1021/acsami.2c22617
DA - 2023-04-07
UR - https://www.deepdyve.com/lp/unpaywall/holistic-variability-analysis-in-resistive-switching-memories-using-a-M8gP4p6eHR
DP - DeepDyve
ER -