TY - JOUR
AU1 - Carter, T J
AB - A probe unit and a simple electrometer circuit are described for the measurement of the electron beam currents in an electron microscope. These measurements are used to calculate the thickness of the sample in the microscope.
TI - Thickness measurements in the electron microscope
JF - Journal of Scientific Instruments
DO - 10.1088/0950-7671/44/1/416
DA - 1967-01-01
UR - https://www.deepdyve.com/lp/iop-publishing/thickness-measurements-in-the-electron-microscope-K3d5js3xpl
SP - 61
VL - 44
IS - 1
DP - DeepDyve
ER -