TY - JOUR
AU - Shi, Wei
AB - Based on the analysis of temperature field generated when semi-insulating GaAs photoconductive switch irradiated by light pulse, the paper focuses on the light damage induced by nanosecond laser pulse with 1.06ॖm wavelength at high repetition frequencies in switch materials. On the basis of the thermal conduction theory, the transient temperature field in the materials is simulated in a computer by using the finite difference method, the main reasons of damage induced by laser in chip material are analyzed according to simulation results and experimental results of the damage test, and the damage mechanism is discussed.
TI - Discussion of damage induced by trigger light pulse at high repetition frequencies in semi-insulating GaAs PCSS's materials
JF - Proceedings of SPIE
DO - 10.1117/12.868891
DA - 2010-11-05
UR - https://www.deepdyve.com/lp/spie/discussion-of-damage-induced-by-trigger-light-pulse-at-high-repetition-JSuWgUxt0N
SP - 78441I
EP - 78441I-6
VL - 7844
IS - 1
DP - DeepDyve
ER -