TY - JOUR
AU - Song, Lin
AB - A lifespan prediction model was developed based on a few samples to provide decision-making information for operation and maintenance, as well as improve the economy and safety of nuclear power plant (NPP) operations. This paper applies a Weibull model to forecast the lifespan of electronic cards with a few samples in NPPs. Relationship between the lifespan prediction of electronic cards and the ambient temperature is revealed using the Arrhenius equation. Censored samples are used to compensate for the lack of fault electronic card data. Scale parameter and shape parameter of the Weibull model are optimized by adjusting the weight ratio between the censored data and the fault data. Characteristic life is then obtained using the rank regression fitting equation. Parameters of the Arrhenius equation can be calculated by dividing the samples into groups according to the ambient temperature. A case study of the intermediate range high-voltage electric card of ex-core neutron detectors demonstrates that the lifespan prediction of electronic cards in NPPs can be successfully predicted with a few samples by combining the Weibull model and the Arrhenius model. This can help provide preventive maintenance recommendations for electronic cards. Finally, operation suggestions for the electronic card’s ambient temperature can be made by utilizing the temperature-life model.
TI - Lifespan Prediction of Electronic Card in Nuclear Power Plant Based on Few Samples
JF - Journal of Shanghai Jiaotong University (Science)
DO - 10.1007/s12204-023-2669-9
DA - 2023-11-09
UR - https://www.deepdyve.com/lp/springer-journals/lifespan-prediction-of-electronic-card-in-nuclear-power-plant-based-on-IuTOqI7Sdm
SP - 1
EP - 7
VL - OnlineFirst
IS - 
DP - DeepDyve
ER -