TY - JOUR
AU - Wang, S. C.
AB - We have applied automated wafer scale testing methods to the characterization of arrays of vertical cavity surface emitting semiconductor lasers. The hardware and software for recording light versus current, current versus voltage, optical spectra, and high speed modulation performance are described.
TI - Wafer scale testing of vertical cavity surface-emitting laser arrays
JF - Proceedings of SPIE
DO - 10.1117/12.176642
DA - 1994-06-01
UR - https://www.deepdyve.com/lp/spie/wafer-scale-testing-of-vertical-cavity-surface-emitting-laser-arrays-IDrSuwL94h
SP - 450
EP - 456
VL - 2148
IS - 1
DP - DeepDyve
ER -