TY - JOUR
AU1 - Tobin, Kenneth W.
AU2 - Miller, John W. V.
AB - This Special Section Guest Editorial provides an overview of the topical area and an introduction to the articles featured in the special section.
TI - Guest Editorial: Special Section on Machine Vision for Industrial Inspection
JF - Journal of Electronic Imaging
DO - 10.1117/1.1337356
DA - 2001-01-01
UR - https://www.deepdyve.com/lp/spie/guest-editorial-special-section-on-machine-vision-for-industrial-IBs137KQLp
SP - 194
EP - 195
VL - 10
IS - 1
DP - DeepDyve
ER -