TY - JOUR
AU1 - Pennycook, Stephen J.
AB - imaging of materials. As distinct from the Fourier reconstruction represented by the traditional TEM techniques, the Z-contrast method provides an image Imaging in which can be thought of as a direct image of the atomic structure and atomic num­ ber (Z). In many cases, the image imme­ diately conveys the atomic-scale details of Materials Science the sample, and again we find tli.at these are not ~lways in accord with our previ­ Guest Editor, Stephen J. Pennycook OI.JS notions, as described in the article by D.E. Jesson and S.J. Pennycook. The more familiar scanning electron microscope (SEM), which images bulk Imaging is about communicating. complexity. Robert J. Hamers gives us material, has also evolved significantly Through images, it is possible to convey the flavor of this in his article "Atomic­ in recent years, notably in the use of very information about a subject in an exceed­ Scale Imaging with the Scanning Tun­ low beam voltages, for example, in the ingly efficient manner. We are all famil­ neling Microscope." nondestructive imaging and evaluation iar with the nightly news reports and of semiconductor device structures. One how a few visual images can rapidly con­ radically new design in particular is vey a 
TI - Imaging in Materials Science
JF - MRS Bulletin
DO - 10.1557/s0883769400057353
DA - 1991-03-01
UR - https://www.deepdyve.com/lp/springer-journals/imaging-in-materials-science-B5MMr48jaT
SP - 19
EP - 21
VL - 16
IS - 3
DP - DeepDyve
ER -