TY - JOUR
AU - Rachnikov, D.
AB - Typical noise power density spectra of photoreceivers, manufactured using different industrial technologies are presented. Technologies which reduce the 1/F
α noise are considered.
TI - Noise spectroscopy as a method of monitoring the quality of developed semiconductor devices
JF - Measurement Techniques
DO - 10.1007/s11018-011-9792-y
DA - 2011-10-12
UR - https://www.deepdyve.com/lp/springer-journals/noise-spectroscopy-as-a-method-of-monitoring-the-quality-of-developed-8B936fWIT0
SP - 712
EP - 715
VL - 54
IS - 6
DP - DeepDyve
ER -