TY - JOUR
AU - Chen, Lun-Chi
AB - A defect inspection of resin films involves processes of detecting defects, size measuring, type classification and reflective action planning. It is not only a process requiring heavy investment in workforce, but also a tension between quality assurance with a 50-micrometer tolerance and visibility of the naked eye. To solve the difficulties of the workforce and time consumption processes of defect inspection, an apparatus is designed to collect high-quality images in one shot by leveraging a large field-of-view microscope at 2K resolution. Based on the image dataset, a two-step method is used to first locate possible defects and predict their types by a defect-shape-based deep learning model using the LeNet-5-adjusted network. The experimental results show that the proposed method can precisely locate the position and accurately inspect the fine-grained defects of resin films.
TI - Apparatus and Method of Defect Detection for Resin Films
JO - Applied Sciences
DO - 10.3390/app10041206
DA - 2020-02-11
UR - https://www.deepdyve.com/lp/multidisciplinary-digital-publishing-institute/apparatus-and-method-of-defect-detection-for-resin-films-6flYTb2iXh
SP - 1206
VL - 10
IS - 4
DP - DeepDyve
ER -