TY - JOUR
AU - Pethica, J B
AB - The authors have modified a precision indentation device to allow STM rastering of a tip across a surface, while simultaneously monitoring mechanical contact. Images obtained from this apparatus on a HOPG sample exhibit atomic scale resolution with contact areas much larger than a single atom. They provide a model for this process as shear between atomic planes. The model explains a variety of curious, and otherwise unrelated phenomena occurring during STM imaging of these materials.
TI - A shear model for STM imaging of layered materials
JF - Journal of Physics: Condensed Matter
DO - 10.1088/0953-8984/1/49/003
DA - 1989-12-11
UR - https://www.deepdyve.com/lp/iop-publishing/a-shear-model-for-stm-imaging-of-layered-materials-4RNr4oK1G1
SP - 9823
VL - 1
IS - 49
DP - DeepDyve
ER -