TY - JOUR
AU - Alder, John F
AB - A method is described for the detection and measurement of concealed dielectric layers at a distance using frequency scanned millimetre wave reflectometry, and carrying out a Burg or Fourier transformation of the results. Three dimensional data may potentially be obtained by moving the beam over the surface of the sample. Multiple layers of thickness ranging from 10 mm to 740 mm are readily detected and monitored through their microwave optical properties.
TI - A sensor for the detection and measurement of thin dielectric layers using reflection of frequency scanned millimetric waves
JO - Measurement Science and Technology
DO - 10.1088/0957-0233/19/2/024004
DA - 2008-02-01
UR - https://www.deepdyve.com/lp/iop-publishing/a-sensor-for-the-detection-and-measurement-of-thin-dielectric-layers-4OZ4yw2xo4
SP - 024004
VL - 19
IS - 2
DP - DeepDyve
ER -