TY - JOUR AU1 - Fedotowsky, A AB - The principal type of test for which the circuit is designed is the stair-case charging method which charges an MNOS device under constant oxide field. Other tests such as memory retention and endurance are also described. TI - Computer-controlled MNOS testing circuit JF - Journal of Physics E: Scientific Instruments DO - 10.1088/0022-3735/12/9/003 DA - 1979-09-01 UR - https://www.deepdyve.com/lp/iop-publishing/computer-controlled-mnos-testing-circuit-4J0b0EZ9Xc SP - 809 VL - 12 IS - 9 DP - DeepDyve ER -