TY - JOUR
AU - Bailey, Tim
AB - As integrated optical components become increasingly available, the need for an understanding of methods for characterization of these devices becomes necessary. This paper discusses several techniques for characterization of Ti:LiNb0 3 devices including waveguides, polarizers and phase modulators. Measurement aspects common to all devices are discussed such as polarization requirements, wavelength, power restrictions and power measurement. In addition, specific techniques for measurement of optical loss, fiber to chip coupling, optical retardation and polarization extinction are given.
TI - Optical Characterization Of Integrated Optical Devices
JF - Proceedings of SPIE
DO - 10.1117/12.942356
DA - 1988-03-10
UR - https://www.deepdyve.com/lp/spie/optical-characterization-of-integrated-optical-devices-4CjSQKolrp
SP - 218
EP - 228
VL - 835
IS - 
DP - DeepDyve
ER -