TY - JOUR
AU - Goldina, N. D.
AB - A new version of the reflecting interferometer for \documentclass[12pt]{minimal}\usepackage{amsmath}\usepackage{wasysym}\usepackage{amsfonts}\usepackage{amssymb}\usepackage{amsbsy}\usepackage{mathrsfs}\usepackage{upgreek}\setlength{\oddsidemargin}{-69pt}\begin{document}$$S$$\end{document}-polarized light consisting of a thin metal film placed in front of a multilayer dielectric interferometer is considered. The appearance of narrow extremes in the spectral or angular dependence of the reflection coefficient depends on the location of the metal film in the node or antinode of the standing wave reflected from the interferometer (maxima or minima).
TI - Transformation of the Optical Characteristics of the Reflecting Interferometer in Polarized Light
JO - Optoelectronics, Instrumentation and Data Processing
DO - 10.3103/s8756699021020072
DA - 2021-03-01
UR - https://www.deepdyve.com/lp/springer-journals/transformation-of-the-optical-characteristics-of-the-reflecting-3uocJWcEoT
SP - 220
EP - 223
VL - 57
IS - 2
DP - DeepDyve
ER -