TY - JOUR
TI - Rework of multi-chip modules: device removal
JF - Microelectronics Reliability
DO - 10.1016/0026-2714(94)90165-1
DA - 1994-08-01
UR - https://www.deepdyve.com/lp/crossref/rework-of-multi-chip-modules-device-removal-3WWEBXt008
SP - 1410
VL - 34
IS - 8
DP - DeepDyve
ER -