TY - JOUR
AU1 - Träbert, E
AB - Electron beam ion traps have been employed to measure very short (femtosecond) and long (microsecond to many millisecond) level lifetimes in highly charged ions. The lifetime measurement techniques reflect interesting properties of the apparatus. The measurement of very short lifetimes exploits the fact that the Doppler broadening in electron beam ion traps can be reduced to below the natural line width. For the measurement of long lifetimes (measured on electric-dipole forbidden transitions), the electron beam ion trap is switched periodically between electronic and magnetic trapping modes. It is then also necessary to learn about the charge exchange processes that limit long term ion storage. Investigations of the sources of systematic error as well as cross checks with heavy-ion storage ring techniques have confirmed that electron beam ion trapping techniques are capable of delivering accurate lifetime data. The best atomic lifetime data achieved with electron beam ion traps have reached uncertainties of less than one percent.
TI - Atomic lifetime measurements with electron beam ion traps
JF - Journal of Physics: Conference Series
DO - 10.1088/1742-6596/72/1/012006
DA - 2007-06-01
UR - https://www.deepdyve.com/lp/iop-publishing/atomic-lifetime-measurements-with-electron-beam-ion-traps-0oVGOYFs5s
SP - 012006
VL - 72
IS - 1
DP - DeepDyve
ER -