TY - JOUR
AU - Fenning, David P.
AB - The correlations in multi-modal microscopy data can be systematically reduced by the distinct probe-sample interactions and signal collection geometry for each modality. Extracting scientific insights from correlative datasets thus requires careful consideration of the mode-specific, and often non-overlapping, sampling volume used in the correlative microscopy. Here we describe a pencil beam, ray tracing method that accounts for the finite extent and roughness of thin-films and nanomaterials in synchrotron-based X-ray microscopy measurements, creating a first approximation of the probe-sample interaction for each modality that tightens correlations in multi-modal X-ray nanoprobe characterization. As a demonstrative example we analyze structure–function correlations in sequential microscopy data acquired for a Eu:CsPbBr3 halide perovskite thin-film crystal across three distinct measurement modes. Our ray-traced corrections account for local fluorescence matrix effects and sampling volume discrepancies and unveil structural, compositional, and optoelectronic relationships hidden in the raw data.Graphic abstract[graphic not available: see fulltext]
TI - Accounting for sample morphology in correlative X-ray microscopy via ray tracing
JF - MRS Advances
DO - 10.1557/s43580-021-00114-0
DA - 2021-09-01
UR - https://www.deepdyve.com/lp/springer-journals/accounting-for-sample-morphology-in-correlative-x-ray-microscopy-via-0jdGPH5axw
SP - 547
EP - 553
VL - 6
IS - 22
DP - DeepDyve
ER -