TY - JOUR
AU - Górecki, Paweł
AB - Abstract In the paper selected methods of measuring the thermal resistance of an IGBT (Insulated Gate Bipolar Transistor) are presented and the accuracy of these methods is analysed. The analysis of the measurement error is performed and operating conditions of the considered device, at which each measurement method assures the least measuring error, are pointed out. Theoretical considerations are illustrated with some results of measurements and calculations.
TI - The Analysis Of Accuracy Of Selected Methods Of Measuring The Thermal Resistance Of IGBTs
JF - Metrology and Measurement Systems
DO - 10.1515/mms-2015-0036
DA - 2015-09-01
UR - https://www.deepdyve.com/lp/de-gruyter/the-analysis-of-accuracy-of-selected-methods-of-measuring-the-thermal-0UaucUEO34
SP - 455
VL - 22
IS - 3
DP - DeepDyve
ER -