%0 Journal Article
%T Degradation Characteristics of AlGaN/GaN MOS-Heterostructure FETs by Alpha-Particle Irradiation
%A Keum, Dongmin
%A Cho, Geunho
%A Kim, Hyungtak
%J ECS Journal of Solid State Science and Technology
%V 6
%N 11
%@ 2162-8769
%D 2017-01-01
%~ DeepDyve