%0 Journal Article
%T Estimating Low-Temperature RTS Rate in MCT FPA Through High-Temperature Noise Measurements
%A Claret, Antoine
%A Cervera, Cyril
%A Baier, Nicolas
%A Gravrand, Olivier
%A Kerlain, Alexandre
%A Rubaldo, Laurent
%A Goiffon, Vincent
%J Journal of Electronic Materials
%V 53
%N 10
%P 5813-5819
%@ 0361-5235
%D 2024-10-01
%I Springer US
%~ DeepDyve