%0 Journal Article
%T Statistical Rare-Event Analysis and Parameter Guidance by Elite Learning Sample Selection
%A Zhao, Yue
%A Kim, Taeyoung
%A Shin, Hosoon
%A Tan, Sheldon X.-D.
%A Li, Xin
%A Chen, Haibao
%A Wang, Hai
%J ACM Transactions on Design Automation of Electronic Systems (TODAES)
%V 21
%N 4
%@ 1084-4309
%D 2016-05-27
%I Association for Computing Machinery
%~ DeepDyve